Earticle

Combinatorial testing has been proved to be an efficient strategy in software testing. The research on automatic test case generation for system level based on components with constraints is a challenging but significant problem by using combinatorial testing. This paper focuses on the test case generation for system level based on components with sequential constraints. There are three main contributions: 1) the new test case generation strategy for system level is proposed based on IPOG (In-Parameter-Order-General) algorithm; 2) a filling strategy for don’t care positions is given to enhance the higher strength coverage for system level, which can improve the quality of the generated test suite; 3) a randomized post-optimization algorithm is applied to reduce the size of the test suite for system level. Experimental results show that the proposed filling strategy can improve the quality of the covering array, the post-optimization algorithm has a good optimization effect on reducing the size of the array, and trades off better between the size of the covering array and computational time than simulated annealing (SA).