This paper presents an innovative metric based on a class abstraction to capture aspects of software complexity through combinations of class characteristics. The study also used software metrics effectiveness in finding the classes in different error categories for the three versions of Eclipse, the Java-based open-source Integrated Development Environment. Many studies used Logistic regression models to investigate the ability of OO software metrics to predict fault prone classes. We also used this method not only for binary but also multinomial categorization and empirically validate the ability of metrics to predict fault prone classes in different category using fault data. We conclude that this proposed metric is as effective as the traditional metrics in identifying fault-prone classes in binary categorization and also showing most efficient result for multinomial categorization. We also find that Univariate model for these metrics have same performance as the individual metric with no any learning technique in prediction of fault-proneness.
목차
Abstract 1. Introduction 2. Proposed Complexity Metric 2.1. Definition 2.2. Criteria for Taxonomy 3. Experimental Design 4. Research Methodology 4.1. Binary Logistic Regression 4.2. Multinomial Logistic regression 4.3. Model Evaluation Criteria 5. Experimental Analysis 5.1. Descriptive Analysis 5.2. Logistic Regression Models 6. Validation Results 7. Model Application 8. Conclusions and Future Work References APPENDIX
보안공학연구지원센터(IJSEIA) [Science & Engineering Research Support Center, Republic of Korea(IJSEIA)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Software Engineering and Its Applications
간기
월간
pISSN
1738-9984
수록기간
2008~2016
등재여부
SCOPUS
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Software Engineering and Its Applications Vol.9 No.2