This paper present the development of a SPICE SiC JFET model and its corresponding characterization process. The device under study is a 1.3 kV, 15 A SiC JFET prototype manufactured by SiCED, packaged in a TO-220 case. The static and dynamic behavior of the SiC power JFET is simulated and compared to the measured data to show the accuracy of the Spice model. The switching characteristics have been tested on a double pulse tester under multiple conditions. A similar double pulse test circuit with parasitics in consideration has been simulated in Spice with the MOSFET model, which gave good results.
목차
Abstract 1. Introduction 2. SiC JFET Structure 3. SPICE SiC JFET Model 4. Characterizations of SiC JFET and Model Parameter Extractions 4.1. Static I-V Characteristics 4.2. Body Diode Characteristics 5. Model Verifications 6. Conclusions References
키워드
SiC JFETPower DevicesModelingSimulationHigh voltageSpiceMatlab
저자
Messaadi Lotfi [ Department of Electronics, Advanced Electronic Laboratory (LEA), Batna University, Avenue Mohamed El-hadi Boukhlouf, 05000,Batna, Algeria ]
Dibi Zohir [ Department of Electronics, Advanced Electronic Laboratory (LEA), Batna University, Avenue Mohamed El-hadi Boukhlouf, 05000,Batna, Algeria ]
보안공학연구지원센터(IJUNESST) [Science & Engineering Research Support Center, Republic of Korea(IJUNESST)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of u- and e- Service, Science and Technology
간기
격월간
pISSN
2005-4246
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of u- and e- Service, Science and Technology Vol.7 No.5