Earticle

초록

영어

The application of Static Random-Access Memory (SRAM), becomes more and more widely in aviation. However, the large amount of SRAM cells is very vulnerable to radiation included single-event upset (SEU). Based on the detection requirement of SRAM’s SEU, the detected circuit of the SEU on SRAM is designed. Then the method of redundancy check is used in the reinforcement of the SEU. The test results shows that the detection circuit can detect the SRAM-type storage chip sensitive bit of the single particle and the proposed method can improved the performance of anti-single particles of SRAM several times as high as 1E6.

목차

Abstract
 1. Introduction
 2. SEU Detection Circuit of SRAM
  2.1. The Detection System Board of the SRAM’SEU
  2.2. The Data Flow of Test System
 3. The Design of the Logic Module Inside the FPGA
  3.1. Serial Transmission and the Section of FIFO
  3.2. CRC Checking Module
  3.3. Dual Redundant Module
 4. Analysis of Simulation Result
  4.1. Simulation Test Results of SEU Fault Detection Circuit
  4.2. Logic Analyzer Results of SEU Fault Detection Circuit
  4.3. The Validation Result of the Method of CRC
  4.4. The test of the Reinforcement Effect based on the Redundancy Check Method
 5. Conclusion
 Acknowledgements
 References

키워드

저자

• Peng Wang [ Tianjin Key Laboratory for Civil Aircraft Airworthiness and Maintenance, Civil Aviation University of China, Tianjin 300300, China ]
• Chengxiang Jiang [ College of Safety Science & Engineering, Civil Aviation University of China, Tianjin 300300, China ]
• Zhen Li [ College of Safety Science & Engineering, Civil Aviation University of China, Tianjin 300300, China ]
• Qiannan Xue [ Tianjin Key Laboratory for Civil Aircraft Airworthiness and Maintenance, Civil Aviation University of China, Tianjin 300300, China ] Corresponding author
• Yi Tian [ Tianjin Key Laboratory for Civil Aircraft Airworthiness and Maintenance, Civil Aviation University of China, Tianjin 300300, China ]

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  International Journal of Hybrid Information Technology

• 간기

  격월간

• pISSN

  1738-9968

• 수록기간

  2008~2016

• 십진분류

  KDC 505 DDC 605