In Hwa Choi, Jong Ho Paik, Jun Hwang, Jaehyoun Kim
언어
영어(ENG)
URL
https://www.earticle.net/Article/A207560
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원문정보
초록
영어
This paper defines a new type of faults that can happen in the integration of embedded systems. When reusing a hardware component combining with a new software component, there can be discrepancy among the interfaces of the legacy hardware and the new software. IDF (interface discrepancy fault) means the faults that come from discrepancy between interfaces of reused hardware (legacy codes) and a new software to combine with. This paper defines the IDF model for embedded software testing. In this paper, the DFS (Depth First Search) algorithm is enlarged to insert IDF node and is used to automatically produce test scenarios considering the interface discrepancy. The resulted test scenarios raise the test coverage and help the testers to check the interface discrepancy faults between the HW and SW for embedded modules, which have usually been ignored and consumed much of the clueless efforts
목차
Abstract 1. Introduction 2. IDF (Interface Discrepancy Fault) Model 3. Test Scenario Generation Algorithm based on IDF Model 3.1. Activity Diagram Generation 3.2. Graph Drawing by using Activity Diagram 3.3. Test Scenario Generation Algorithm using the Graph 4. Conclusions References
키워드
Software Interface fault modelIDFTest scenarioInterface fault test
저자
In Hwa Choi [ Department of Multimedia, Seoul Women’s University ]
Jong Ho Paik [ Department of Multimedia, Seoul Women’s University ]
Jun Hwang [ Department of Multimedia, Seoul Women’s University ]
Jaehyoun Kim [ Department of Computer Education, Sungkyunkwaqn University ]
보안공학연구지원센터(IJCA) [Science & Engineering Research Support Center, Republic of Korea(IJCA)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Control and Automation
간기
월간
pISSN
2005-4297
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Control and Automation Vol.5 No.2