Earticle

초록

영어

Since open platforms such as Android vary in device manufacturers and application developers, modifications in software happened in multiple layers. Therefore, every layer including OS, library, framework and application may have defects within. Especially, a memory leakage which increases memory usage and diminish overall system performance is the key issue in embedded systems with highly limited resources.
In this paper, we suggest a technique that detects memory leakage by gathering memory execution information in run-time via PCB hooking and apply this technique to actual Android smartphones. The suggested technique does not require a target source code and any hardware changes for memory leakage detection, and it is characterized by maintaining the same target runtime status even in detecting while minimizing performance overhead simultaneously. We implemented an automated tool of this technique for Android Smartphone, and show that it is effective.

목차

Abstract
 1. Introduction
 2. Memory Leakage Detection
 3. Case Study
 5. Conclusion
 Acknowledgements
 References

키워드

저자

• Jihyun Park [ Dept. of Computer Science & Engineering Ewha Womans University, Seoul, Korea ]
• Byoungju Choi [ Dept. of Computer Science & Engineering Ewha Womans University, Seoul, Korea ] Corresponding author

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  International Journal of Control and Automation

• 간기

  월간

• pISSN

  2005-4297

• 수록기간

  2008~2016

• 십진분류

  KDC 505 DDC 605