This paper introduces reliability stress screening(RSS) for electronic hardware and components. This study also shows reliability centered maintenance(RCM), and reliability growth models. Moreover, this paper presents goodness-of-fit tests and estimation methods of power law model.
목차
Abstract 1. 서론 2. 신뢰성 스트레스 스크리닝 2.1 전자 제품[1] 2.2 전자 부품[2] 3.1 신뢰성 성장 [3] 3.2 누승/거듭 제곱 법칙 모델 [4] 3.3 RCM[5] 4. 결론 5. 참고문헌