Earticle

초록

영어

BIST is a design technique that allows a circuit to test itself. The technique can provide shorter test time compared to an externally applied test and allows the use of low-cost test equipment during all stages of production. Due to the randomness properties of Linear Feedback Shift Registers (LFSRs), this requires very little hardware overhead. In this paper, structure design and optimization of a Built-In Self-Test (BIST) design based on twodimensional (2-D) Linear Feedback Shift Registers (LFSRs) are described. The 2-D LFSRs can generate both precomputed test patterns (for detecting random-pattern-resistant faults) and random patterns (for detecting random-pattern-detectable faults) and have the advantages of high fault coverage and at-speed testing. The configurable 2-D LFSR test generator can be adopted in two basic BIST execution options: test-per-clock (parallel BIST) and test-per-scan (serial BIST). Generally, a circuit or system consumes more power in test mode than in normal mode. This extra power consumption can give rise to severe hazards in circuit. For LFSR-Reseeding Scheme takes advantage of the fact that the number of transitions in a test cube is always less than the number of blocks that do not contain transitions, the logic value fed into the scan chain is simply held constant. This approach reduces the number of transitions in the scan chains and thus minimizing power consumption.

목차

Abstract
 1. INTRODUCTION
 2. OVERALL BLOCK DIAGRAM
  2.1 Two-Dimensional (2-D) Linear Feedback Shift Registers (LFSRS)
  2.2 Circuit Under Test (CUT)
  2.3 Output Response Analyzer (ORA)
 3. Two-dimensional (2-d) linear feedback shift registers (LFSRs)
  3.2 Conventional LFSRs
  3.3 Precomputed test pattern generation
  3.4 Configurable 2-D LFSRs
  3.5 Test-per-clock (parallel BIST)
  3.6 Test-per-scan (serial BIST)
 4. LFSR-Reseeding Scheme
 5. RESULTS AND DISCUSSIONS
 6. CONCLUSION
 REFERENCES

키워드

저자

• Saranyadevi.S [ II M.E (VLSI Design) K.S.Rangasamy College of Technology(Autonomous), Affiliated to Anna University, Tiruchengode, Namakkal Dist. ]
• Thangavel.M [ Professor/Department of ECE K.S.Rangasamy College of Technology(Autonomous), Affiliated to Anna University, Coimbatore ]

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  International Journal of Advanced Science and Technology

• 간기

  월간

• pISSN

  2005-4238

• 수록기간

  2008~2016

• 십진분류

  KDC 505 DDC 605