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Database applications play an important role in nearly every organization, yet little has been done on testing of database applications. They are becoming increasingly complex and are subject to constant change. They are often designed to be executed concurrently by many clients. Testing of database application hence is of utmost importance to avoid any future errors encountered in the application, since a single fault in database application can result in unrecoverable data loss. Many tools and frameworks for performing testing of database applications has been proposed to populate the test database and generate test cases which checks the correctness of application. They check database applications for consistency constraints and transactions concurrency. In this paper we present a DBGEN- database (test) GENerator, an automated framework for database application testing. In this framework Test Strategies for testing of embedded SQL queries within imperative language are presented. Finally we present strategies for performing efficient regression tests by reducing the resets that may occur while testing database applications. We have also computed the coverage of various test cases to predict the quality of testing. By this, we reduce the testing time and cost by approximately by 30% , thereby easing the tester to manage his testing activities easily.

The testing processes for VLSI finished devices are considerably complex because they require different types of ATE to be linked together. Due to the interaction effect between two or more linked ATEs, it is difficult to trace down the cause of the unexpected longer ATE setup time and random yields, which frequently occur in the VLSI circuit-testing laboratory. The goal of this paper is to develop and demonstrate the methodology designed to eliminate the possible interaction factors that might affect the random yields and/or unexpected longer setup time as well as increase the productivity. The statistical method such as design of experiment or multivariate analysis cannot be applied to the final testing floor here directly due to the environmental constraints. Expanded product data information (PDI) is constructed by combining product data information and ATE control information. An architecture utilizing expanded PDI is designed, which enables the engineer to conduct statistical approach investigation and reduce the setup time, as well as increase yield.

데이터베이스의 의미는 '논리적으로 연관된 레코드나 파일의 모임'으로 방대한 자료를 효율적으로 관리하기 위해 많은 양의 자료를 처리하는 곳에서 널리 사용되고 있다. 이러한 데이터베이스를 생성하고, 관리하고, 사용자의 요구(Request)에 따라 응답(Response)을 보내는 프로그램들을 데이터베이스 관리시스템이라고 부른다. 본 연구에서는, 이와 같이 중요한 데이터베이스 소프트웨어 제품의 품질 수준을 파악할 수 있는 지표를 도출하여 지표산식을 정의하였다. 또한, 지표의 결과를 산출하기 위해 필요한 수집항목을 선정하며 수집과 분석을 통해 실질적으로 어떤 결함유형들이 주로 발생하고 있는지를 확인하였으며 데이터베이스 소프트웨어에 대한 시험 평가모델을 개발하여 시험 사례를 분석하였다.

The meaning of Database in order to manage the data which is huge in the meeting of the record which logically had become the fire tube or file 'efficiently' is widely used from the place which controls a many double meaning data. Like this data base it creates, it manages, the programs which send an answer back according to demand of the user as DBMS it calls. Like this it will be able to grasp the quality level of the data base software product which is important index from the research which index it buys it defined. Also, in order to produce the result of index it selects the collection item which is necessary and collection and analysis it leads and what kind of defect types occur substantially mainly, and it confirmed and the test and evaluation model in about data base software and a tentative instance it developed it analyzed.