ICNGC 2025 The 11th International Conference on Next Generation Computing 2025 (2025.12)바로가기
페이지
pp.107-110
저자
Joonha Park, Siyoung Kim, Sihyung Kim, Jaehyun Cha, Wonsuk Kim, Yoojoong Kim
언어
영어(ENG)
URL
https://www.earticle.net/Article/A478471
원문정보
초록
영어
The imbalance of datasets is a significant challenge in training deep neural networks. Especially in manufacturing, there is only one form of ‘normal’, while defects are endless. This disproportion in sample distribution makes models prone to overfitting, resulting in degraded performance. To mitigate this problem, we propose C4, a Color-Channel Concatenation with Contrastive Loss, a defect detection framework based on Siamese Networks. We performed a case study on industrial automation technologies, especially in sealant defect classification. C4 achieves an F1- score of 94.54% and an accuracy of 94.21%, demonstrating its effectiveness in handling class imbalance.
목차
Abstract I. INTRODUCTION II. METHODOLOGY III. EXPERIMENTS AND RESULTS A. Experiment Settings B. Experiment Results IV. CONCLUSION AND FUTURE WORK ACKNOWLEDGMENT REFERENCES