Bonghyun Cho, Seongkeon Park, Garam Hahn, Seyong Choi, Jiho Lee
언어
한국어(KOR)
URL
https://www.earticle.net/Article/A466924
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원문정보
초록
영어
Accurate measurement of contact resistance in no-insulation (NI) high-temperature superconducting (HTS) coils is crucial for their performance evaluation. The sudden discharge test is a widely used method for measuring the contact resistance of NI HTS coils. However, there are several issues regarding the data acquisition system (DAQ) during the test. In particular, the DAQ must operate at a sampling rate exceeding 500 S/s. An infinite impulse response (IIR) filter can introduce a phase delay into the filtered signal compared to the original data. For instance, applying a 4-Hz low-pass Butterworth filter to a high-frequency signal may lead to measurement errors due to this delay. Moreover, remnant field induced by the screening current after the current transportation introduces uncertainty of conducting sudden discharge tests. This paper proposes the qualified settings of DAQ system configuration for sudden discharge test and suggests an alternative method for measuring the contact resistance of NI HTS coils.
목차
Abstract 1. INTRODUCTION 2. 무절연 고온초전도 코일의 접촉저항 측정 시험 2.1. 급속 방전 시험 2.2. 전류 충방전 시험을 통한 전압 기반 접촉저항 측정 방법 3. 결론 ACKNOWLEDGMENT REFERENCES
키워드
contact resistancedata acquisitionscreening current induced magnetic field
저자
Bonghyun Cho [ Department of Electrical and Electronic Engineering, Pusan National University, Busan, Korea ]
Seongkeon Park [ Department of Electrical Engineering, Kangwon National University, Chuncheon, Korea ]
Garam Hahn [ Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang, Korea ]
Seyong Choi [ Department of Electrical Engineering, Kangwon National University, Chuncheon, Korea ]
Jiho Lee [ Department of Electrical and Electronic Engineering, Pusan National University, Busan, Korea/Robotics Institute of Non-Destructive Inspection, Pusan National University, Busan, Korea ]
Corresponding Author