Hoon Jung, Yoon Seok Chae, June Hee Han, Ji Hyung Kim, Seung Hoon Lee, Ho Chan Kim, Young Soo Yoon, Ho Min Kim
언어
영어(ENG)
URL
https://www.earticle.net/Article/A437960
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초록
영어
The evaluation of no-insulation (NI) high-temperature superconducting (HTS) typically uses the lumped equivalent circuit (LEC) model. Constant parameters in the NI HTS LEC model accurately predict voltage and central magnetic field at currents below the critical current. However, it is difficult to find constant circuit parameters that simultaneously satisfy the measured voltage and magnetic field under overcurrent conditions. Recent research highlights changes in contact resistance during transient conditions, which may impact power loss estimation in NI HTS coils. Therefore, we confirm the influence of contact resistance changes on loss calculation in the transient state for NI HTS coil. To achieve this, we introduce a measurement data analysis method based on the LEC model and compare it with the LEC model using constant circuit parameters.
목차
Abstract 1. INTRODUCTION 2. LUMPED-EQUIVALENT CIRCUIT MODEL AND DATA PROFILING METHOD 2.1. Lumped-equivalent circuit model of NI HTS coil 2.2. Field-based data profiling analysis method 3. ANALYSIS RESULTS OF OVER-CURRENT EPXRIMENT 3.1. Comparison with Experimental and LEC Simulation Results 3.2. Comparison with Experimental and LEC Simulation Results 4. CONCLUSION ACKNOWLEDGMENT REFERENCES