The 8th International Conference on Next Generation Computing 2022 (2022.10)바로가기
페이지
pp.115-117
저자
Dong Jin, Ri Zheng, HeLin Yin, Hun Cho, Yeong Hyeon Gu, Seong Joon Yoo
언어
영어(ENG)
URL
https://www.earticle.net/Article/A419753
원문정보
초록
영어
The recognition of crop diseases and pests based on images is one of the required techniques to identify damage due to diseases and pests and to take efficient management and prior actions. With the development of deep learning technology, the image recognition of diseases and pests using deep learning exhibited excellent performance and plays an important role in managing and controlling diseases and pests of crops. However, research on image recognition of diseases and pests in crops is facing difficulties due to the lack of large-scale datasets about diseases and pests. To solve this problem, this study proposes a system to manage and annotate the images of diseases and pests that can efficiently manage collected disease and pest images to generate high-quality disease and pest datasets. The proposed disease and pest image management and annotation system can collect disease and pest images uploaded from various sources and create statistics of them. It can also provide image inspection and user-friendly annotation functions.
목차
Abstract I. INTRODUCTION II. RELATED WORK III. DISEASE AND PEST IMAGE DATASET MANAGEMENT SYSTEM A. Data Management and Analysis Module B. Image Inspection Module C. Image Annotation Module IV. CONCLUSION AND FUTURE WORK REFERENCES
키워드
CMSdatasetdeep learningplant diseasepest
저자
Dong Jin [ Department of Computer and Engineering Department of Convergence Engineering for Intelligent Drone Sejong University Seoul, Korea ]
Ri Zheng [ Department of Computer and Engineering Department of Convergence Engineering for Intelligent Drone Sejong University Seoul, Korea ]
HeLin Yin [ Department of Computer and Engineering Sejong University Seoul, Korea ]
Hun Cho [ Dayludens Seoul, Korea ]
Yeong Hyeon Gu [ Department of Computer and Engineering Sejong University Seoul, Korea ]
Corresponding Author
Seong Joon Yoo [ Department of Computer and Engineering Sejong University Seoul, Korea ]