Changhyung Lee, Seungyong Hahn, Jeseok Bang, Jeonwook Cho, Seokho Kim
언어
영어(ENG)
URL
https://www.earticle.net/Article/A347962
※ 기관로그인 시 무료 이용이 가능합니다.
※ 학술발표대회집, 워크숍 자료집 중 4페이지 이내 논문은 '요약'만 제공되는 경우가 있으니, 구매 전에 간행물명, 페이지 수 확인 부탁 드립니다.
4,000원
원문정보
초록
영어
Due to large in-field current carrying capacity and strong mechanical strength, a REBCO wire has been regarded as a viable high temperature superconductor (HTS) option for high field MRI and > 1 GHz (>23.5 T) NMR magnets. However, a REBCO magnet is well known to have an inherent problem of field inhomogeneity, so-called ‘Screening Current induced magnetic Field (SCF)’. Recently, ‘field shaking’ and ‘current overshoot operation’ techniques have been successfully demonstrated to mitigate the SCF and enhance the field homogeneity by experiments. To investigate the effectiveness of current overshooting operation technique, a numerical simulation is conducted for a test REBCO magnet composed of a stack of double pancake coils using ‘2D edge-element magnetic field formulation’ combined with ‘domain homogenization’ scheme. The simulation result demonstrates that an appropriate amount of current overshoot can negate the SCF. To verify the simulation results, current overshoot experiments are conducted for the REBCO magnet in liquid nitrogen. Experimental results also demonstrate the possible application of current overshoot technique to mitigate the SCF and enhance the field homogeneity.
목차
Abstract 1. INTRODUCTION 2. REBCO MAGNET 2.1. Fabrication of the magnet 2.2. Critical current measurement 3. NUMERICAL ANALYSIS OF SCF 3.1. Numerical analysis model 3.2. Numerical analysis results 4. EXPERIMENT 4.1. Experimental set up 4.2. Experimental results 5. DISCUSSION 6. CONCLUTION ACKNOWLEDGMENT REFERENCES
키워드
REBCO magnetfield homogeneityscreening current induced fieldcurrent overshootfield shaking
저자
Changhyung Lee [ School of Mechanical Engineering, Changwon National University, Changwon, Korea, SuperGenics Co. Ltd., Changwon, Korea ]
Seungyong Hahn [ Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea ]
Jeseok Bang [ Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea ]
Jeonwook Cho [ Korea Electrotechnology Research Institute (KERI), Changwon, Korea ]
Seokho Kim [ School of Mechanical Engineering, Changwon National University, Changwon, Korea ]
Corresponding Author