Huu Luong Quach, Ji Hyung Kim, Yoon Seok Chae, Jae Hyung Moon, Jung Hyup Ko, Hyung-Wook Kim, Seog-Whan Kim, Young-Sik Jo, Ho Min Kim
언어
영어(ENG)
URL
https://www.earticle.net/Article/A347952
※ 기관로그인 시 무료 이용이 가능합니다.
※ 학술발표대회집, 워크숍 자료집 중 4페이지 이내 논문은 '요약'만 제공되는 경우가 있으니, 구매 전에 간행물명, 페이지 수 확인 부탁 드립니다.
4,000원
원문정보
초록
영어
This paper presents analytical and numerical simulation approaches on charging characteristics of no-insulation (NI) REBCO pancake coil by using the equivalent circuit model to estimate magnetic performance response in the coil. The analytical methods provide closed form or definite solution in the form of complete mathematical expressions but they are hard to solve the complex problems. Numerical methods have become popular with the development of the computing capabilities to solve the problems which are impossible or very hard to solve analytically. First of all, the equivalent circuit model are proposed to develop the simulation code for both analytical and numerical method. The charging test was performed under critical current to obtain magnetic field induced and terminal voltage through the radial as well as spiral current paths within the coil. To verify the validity of both proposed methods, the simulation results were compared and discussed with the experimental results.
목차
Abstract 1. INTRODUCTION 2. FABRICATION OF AN NI REBCO COIL 3. EQUIVALENT CIRCUIT MODEL AND SIMULATION METHODS 3.1. Analytical Method 3.2. Numerical Method 4. RESULTS AND DISCUSSION 4.1. Sudden Discharge Test 4.2. Charging Test 4. CONCLUSION ACKNOWLEDGMENT REFERENCES
키워드
REBCO coated conductorno-insulation pancake coilcharging behavioranalytical methodnumerical methodequivalent circuit model
저자
Huu Luong Quach [ Department of Electrical Engineering, Jeju National University, Jeju, S.Korea ]
Ji Hyung Kim [ Department of Electrical Engineering, Jeju National University, Jeju, S.Korea ]
Yoon Seok Chae [ Department of Electrical Engineering, Jeju National University, Jeju, S.Korea ]
Jae Hyung Moon [ Department of Electrical Engineering, Jeju National University, Jeju, S.Korea ]
Jung Hyup Ko [ Department of Electrical Engineering, Jeju National University, Jeju, S.Korea ]
Hyung-Wook Kim [ Korea Electrotechnology Research Institute, Changwon, Korea ]
Seog-Whan Kim [ Korea Electrotechnology Research Institute, Changwon, Korea ]
Young-Sik Jo [ Korea Electrotechnology Research Institute, Changwon, Korea ]
Ho Min Kim [ Department of Electrical Engineering, Jeju National University, Jeju, S.Korea ]
Corresponding Author