Acoustic Emission (AE) source localization is a useful implement to diagnose the incipient faults in rotating machine. This paper proposes an improved Near-field Multiple Signal Classification method using four-order cumulants (NFC-MUSIC) to accurately locate the faults position. In order to overcome dispersion effect and revised velocity, the feature sub narrow band is extracted by Wavelet Packet reconstitution (WPR) and Modal Plate Wave Theory (MPWT). For multi-source decorrelation and increasing localized resolution, the four-order cumulants of observed signal can be selected for localization. The experiment results indicate that the improved method can accurately locate multi-rubbing faults. It is an efficient way to assist incipient rubbing faults diagnosis.
목차
Abstract 1. Introduction 2. The Pre-Processing of AE Signals 3. The Proposed AE Source Localization Algorithm 3. Experiments 4. Simulations and Evaluations 4.1. WPT for Zero-Order Modal Extraction 4.2. NFC-MUSIC Algorithm Localization Results 5. Conclusions References
키워드
Rubbing FaultAcoustic EmissionNear FieldMultiple Signal Classification
저자
Jing Li [ School of Information Engineering, Southeast University, Nanjing, China ]
Yong Yang [ School of Resources and Geosciences, China University of Mining and Technology, Xuzhou, China / School of Information and Electrical Engineering, Xuzhou, China ]
Xinghua Li [ Chengdu BOE Optoelectronics Technology Co., Ltd., Chengdu, China ]
Li Zhao [ School of Information Engineering, Southeast University, Nanjing, China ]
보안공학연구지원센터(IJSIP) [Science & Engineering Research Support Center, Republic of Korea(IJSIP)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Signal Processing, Image Processing and Pattern Recognition
간기
격월간
pISSN
2005-4254
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Signal Processing, Image Processing and Pattern Recognition Vol.9 No.11