Earticle

초록

영어

As the advancement in technology the number of application per chip is increasing and chip area remain same. If number of application per chip is increasing so the difficulty level of analog circuit becomes more and more complex. So there are various fault occur in analog VLSI circuits during manufacturing of any analog circuit. If these faults cannot diagnose and remove at initial stage then it will lead to various changes in output of system, which increase the overall cost. In this article we focused on modeling, analysis and diagnosis of various faults which occur in analog VLSI circuit. We describe new approach to diagnose parametric and catastrophic fault in analog circuits with the help of signal flow graph technique. This technique is very simple and structural in nature. It is applicable to various linear analog VLSI circuits. In this paper we implement this approach on MIMO (Multi Input Multi Output Circuit).All the equation and model for MIMO circuit and simulation are done with the help of MATLAB/Simulink tool.

목차

Abstract
 1. Introduction
 2. Fault Modeling of Analog Circuits
 3. Example of SFG Technique
  3.1. Algorithm for SFG Inversion
 4. Analysis of Fault in MIMO Circuit
  4.1. Mathematical Calculation for Faulty Resistor 𝐑𝟐
  4.2. Mathematical Calculation for Faulty Capacitor C
 5. Catastrophic Fault Diagnosis in MIMO Circuit
 6. Conclusion
 References

키워드

저자

• Sandeep Thakur [ Department of Electronics and Telecommunication Engineering, MGMCET Kamothe, India ]

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  International Journal of Signal Processing, Image Processing and Pattern Recognition

• 간기

  격월간

• pISSN

  2005-4254

• 수록기간

  2008~2016

• 십진분류

  KDC 505 DDC 605