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Specular Highlight Removal for High Reflection Surface with Linear Diffuser

첫 페이지 보기
  • 발행기관
    보안공학연구지원센터(IJSIP) 바로가기
  • 간행물
    International Journal of Signal Processing, Image Processing and Pattern Recognition 바로가기
  • 통권
    Vol.9 No.9 (2016.09)바로가기
  • 페이지
    pp.33-40
  • 저자
    Sun Xiaoming, Liu Ye, Yu Xiaoyang, Wang Pingjing, Zhao Dan
  • 언어
    영어(ENG)
  • URL
    https://www.earticle.net/Article/A284962

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원문정보

초록

영어
In structured light 3D measurement field, when the object has smooth surface, it can form a highlight area due to the specular reflection, and the distortion of the object will make a large measurement error. In order to solve this problem, this paper use seven steps sine-phase shift combined with linear diffuser to remove highlight. Firstly, the principle of removing specular with diffuser is analyzed, then the overall design of the system is introduced, which includes 3D reconstruction and system calibration method. Finally the reconstructed experiments are carried out with ceramic plate. Experimental results show that the proposed method can significantly reduce the highlights area of reconstructed image compared with the highlights area without diffuser. The diffuser can obviously inhibited by highlights, although it can not completely remove the highlights, it plays a very important role in reconstructing specular object with more accurate and better quality.

목차

Abstract
 1. Introduction
 2. The Principal of Removing Highlights with Diffuser
 3. System Introduction
  3.1. System Design
  3.2. Camera Calibration
  3.3. Projector Calibration
 4. Experiment
 5. Conclusions
 Acknowledgments
 References

키워드

Structured light 3D measurement Specular highlight linear diffuser

저자

  • Sun Xiaoming [ The higher Educational Key Laboratory for Measuring & Control Technology and Instrumentations Harbin University of Science and Technology Heilongjiang Province, Harbin 150080, China ] Corresponding author
  • Liu Ye [ The higher Educational Key Laboratory for Measuring & Control Technology and Instrumentations Harbin University of Science and Technology Heilongjiang Province, Harbin 150080, China ]
  • Yu Xiaoyang [ The higher Educational Key Laboratory for Measuring & Control Technology and Instrumentations Harbin University of Science and Technology Heilongjiang Province, Harbin 150080, China ]
  • Wang Pingjing [ The higher Educational Key Laboratory for Measuring & Control Technology and Instrumentations Harbin University of Science and Technology Heilongjiang Province, Harbin 150080, China ]
  • Zhao Dan [ The higher Educational Key Laboratory for Measuring & Control Technology and Instrumentations Harbin University of Science and Technology Heilongjiang Province, Harbin 150080, China ]

참고문헌

자료제공 : 네이버학술정보

간행물 정보

발행기관

  • 발행기관명
    보안공학연구지원센터(IJSIP) [Science & Engineering Research Support Center, Republic of Korea(IJSIP)]
  • 설립연도
    2006
  • 분야
    공학>컴퓨터학
  • 소개
    1. 보안공학에 대한 각종 조사 및 연구 2. 보안공학에 대한 응용기술 연구 및 발표 3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최 4. 보안공학 기술의 상호 협조 및 정보교환 5. 보안공학에 관한 표준화 사업 및 규격의 제정 6. 보안공학에 관한 산학연 협동의 증진 7. 국제적 학술 교류 및 기술 협력 8. 보안공학에 관한 논문지 발간 9. 기타 본 회 목적 달성에 필요한 사업

간행물

  • 간행물명
    International Journal of Signal Processing, Image Processing and Pattern Recognition
  • 간기
    격월간
  • pISSN
    2005-4254
  • 수록기간
    2008~2016
  • 십진분류
    KDC 505 DDC 605

이 권호 내 다른 논문 / International Journal of Signal Processing, Image Processing and Pattern Recognition Vol.9 No.9

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