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Low Leakage Asynchronous PP based Single Ended 8T SRAM bit-cell at 45nm CMOS Technology

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  • 발행기관
    보안공학연구지원센터(IJHIT) 바로가기
  • 간행물
    International Journal of Hybrid Information Technology 바로가기
  • 통권
    Vol.9 No.6 (2016.06)바로가기
  • 페이지
    pp.117-126
  • 저자
    Sonam Jain, Neeraj Kr. Shukla
  • 언어
    영어(ENG)
  • URL
    https://www.earticle.net/Article/A280320

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원문정보

초록

영어
Low power SRAM memory designs has become challenging for portable device applications. Semiconductor/ VLSI industry growth has exponentially demanding low leakage power SRAM designs for high performance chips and microprocessors. To get optimized standard cell memory design for battery operated devices at deep sub micron CMOS technology, a low leakage Asynchronous 8T SRAM is proposed. In this paper gated–ground P-P based low leakage 8T SRAM bit cell design is proposed for reducing the standby leakage power dissipation. The Proposed 8T SRAM bit - cell has used single bit line (single voltage source) for reading and writing operations to reduce active power consumption. The reduction of voltage swing and low standby leakage results appreciable reduction in total power consumption of the proposed design. The SPECTRE simulation and analysis at a 45nm CMOS feature size shows significant results in the proposed design at 0.7v supply voltage. Proposed Asynchronous single ended 8T SRAM bit - cell greatly reduced 99.92% stand by leakage power consumption and 11.76% of write ‘1’ active power consumption from the existing 8T SRAM bi – cell design. Whereas comparing with the standard 6T SRAM bit – cell design, proposed design also achieved 99.88% standby leakage power reduction and 95.8% of total active write ‘1’ power consumption from the conventional 6T SRAM bit – cell. This results overall total average power reduces in the proposed 8T SRAM bit-cell design i.e. reduction of 99.93% from the existing 8T SRAM bit – cell and 80.63% from the conventional 6T SRAM bit – cell design while keep maintaining the read static noise margin and write noise margin.

목차

Abstract
 1. Introduction
 2. Conventional 6T SRAM bit – cell design
 3. Existing 8T SRAM bit – cell design
 4. Proposed Asynchronous Single Ended 8T SRAM bit – cell
  4.1. Write Operation with Single Bit Line
  4.2. Read Operation with Single Bit Line
 5. Analysis and Simulation Work
  5.1. Operation Performance in the Proposed Design
  5.2. Leakage Power Dissipation
  5.3. Write ‘1’ Power Consumption
  5.4. Total Average Power Consumption
  5.5. Stability Analysis
 6. Conclusions
 7. Future Scope
 References

저자

  • Sonam Jain [ PG Student, VLSI Design Group, Department of Electrical, Electronics & Communication Engineering, THE NORTHCAP University, Gurgaon (Haryana) India ]
  • Neeraj Kr. Shukla [ Associate Professor, VLSI Design Group, Department of Electrical, Electronics & Communication Engineering, THE NORTHCAP University, Gurgaon (Haryana) India ]

참고문헌

자료제공 : 네이버학술정보

간행물 정보

발행기관

  • 발행기관명
    보안공학연구지원센터(IJHIT) [Science & Engineering Research Support Center, Republic of Korea(IJHIT)]
  • 설립연도
    2006
  • 분야
    공학>컴퓨터학
  • 소개
    1. 보안공학에 대한 각종 조사 및 연구 2. 보안공학에 대한 응용기술 연구 및 발표 3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최 4. 보안공학 기술의 상호 협조 및 정보교환 5. 보안공학에 관한 표준화 사업 및 규격의 제정 6. 보안공학에 관한 산학연 협동의 증진 7. 국제적 학술 교류 및 기술 협력 8. 보안공학에 관한 논문지 발간 9. 기타 본 회 목적 달성에 필요한 사업

간행물

  • 간행물명
    International Journal of Hybrid Information Technology
  • 간기
    격월간
  • pISSN
    1738-9968
  • 수록기간
    2008~2016
  • 십진분류
    KDC 505 DDC 605

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