Joon-Ho Oh, Dong Jin Kim, Han Soo Kim, Seung Hee Lee, Jang Ho Ha
언어
영어(ENG)
URL
https://www.earticle.net/Article/A278208
원문정보
초록
영어
Background: TlBr is of considerable technological importance for radiation detection applications where detecting high-energy photons such as X-rays and γ-rays are of prime importance. However, there were few reports on investigating optical properties of TlBr itself for deeper understandings of this material and for making better radiation detection devices. Thus, in this paper, we report on the optical characterizations of TlBr single crystals. Spectroscopic ellipsometry (SE) and photoluminescence (PL) measurements at RT were performed for this work. Materials and Methods: A 2-inch TlBr single crystalline ingot was grown by using the vertical Bridgman furnace. SE measurements were performed at RT within the photon energy range from 1.1 to 6.5 eV. PL measurements were performed at RT by using a home-made PL system equipped with a 266 nm-laser and a spectrometer. Results and Discussion: Dielectric responses from SE analysis were shown to be slightly different among the different samples possibly due to the different structural/optical properties. Also from the PL measurements, it was observed that the peak intensities of the middle samples were significantly higher than those of the other two samples. With the given values for permittivity of free space (ε0 = 8.854x10-12 F·m-1), thickness (d = 1 mm), and area (A = 10x10 mm2) of the TlBr sample, capacitances of TlBr were 6.9 pF (at hν = 3 eV) and 4.4 pF (at hν = 6 eV), respectively. Conclusion: SE and PL measurement and analysis were performed to characterize TlBr samples from the optical perspective. It was observed that dielectric responses of different TlBr samples were slightly different due to the different material properties. PL measurements showed that the middle sample exhibited much stronger PL emission peaks due to the better material quality. From the SE analysis, optical, dielectric constants were extracted, and calculated capacitances were in the few pF range.
목차
ABSTRACT 1. INTRODUCTION 2. MATERIALS AND METHODS 3. RESULTS AND DISCUSSION 4. CONCLUSION ACKNOWLEDGEMENTS REFERENCES
키워드
Radiation detectorsSemiconductor single crystalsSpectroscopic ellipsometryPhotoluminescence
저자
Joon-Ho Oh [ Korea Atomic Energy Research Institute, Jeongeup, Republic of Korea ]
Dong Jin Kim [ Korea Atomic Energy Research Institute, Jeongeup, Republic of Korea ]
Han Soo Kim [ Korea Atomic Energy Research Institute, Jeongeup, Republic of Korea ]
Seung Hee Lee [ Korea Atomic Energy Research Institute, Jeongeup, Republic of Korea ]
Jang Ho Ha [ Korea Atomic Energy Research Institute, Jeongeup, Republic of Korea ]
Corresponding author
대한방사선방어학회 [Korean Association For Radiation Protection]
설립연도
1975
분야
자연과학>기타자연과학
소개
회원 상호간의 협조와 친목을 도모함으로써 방사선방어에 관한 제반연구 및 발전에 이바지함을 물론 학술의 국제교류 및 국제학술단체와의 상호협력 증진에 기여함을 목적으로 하며, 이 목적을 달성하기 위하여 다음 각 호의 사업을 한다.
1. 방사선방어에 관한 학술연구발표회 및 강연회 등의 개최
2. 학회지 및 방사선방어에 관한 학술간행물의 발행 및 배포
3. 방사선방어에 관한 학술의 국제교류 및 협력
4. 방사선방어에 관한 국제학술자료의 조사, 수집 및 번역
5. 방사선방어에 관한 조사 및 연구용역
6. 회원의 연구활동을 위한 제반협조
7. 기타 본 학회의 목적 달성에 필요한 사항
간행물
간행물명
방사선방어학회지 [Journal of Radiation Protection and Research]