Weiping Huang, Ziyang Wang, Qinghua Chi, Jun Liang
언어
영어(ENG)
URL
https://www.earticle.net/Article/A270137
※ 원문제공기관과의 협약기간이 종료되어 열람이 제한될 수 있습니다.
원문정보
목차
Abstract 1. Introduction 2. Feature Weighting Algorithms and Application 2.1 Relief Feature Weighting Algorithm 2.2 CSC Feature Weighing Algorithm 2.3 Application of weighing algorithm to classification 3. Interval Type-2 Fuzzy Logic and its Extended Approach 4. Applicatkion of Interval Type-2 Fuzzy Logic in Ensemble SVM 5. Fxperiments and results 5.1. Dataset description 5.2 (a) Experiment Design for SVM Based on Feature weighting 5.2 (b) Result and Discussion of SVM based on Feature Weighting 5.3 (a) Experiment design for ensemble SVM based on type-2 fuzzy logic 5.4 (b) Results and discussion of ensemble SVM based on type- fuzzy logic 6. Conclusion references
키워드
support vector machinefeature weightingtype-2 fuzzy logicensemble classifier
저자
Weiping Huang [ State Key Lab of Industrial Control Technology Department of Control Science & Engineering, Zhejiang Unversity, Hangzhou, China ]
Ziyang Wang [ State Key Lab of Industrial Control Technology Department of Control Science & Engineering, Zhejiang Unversity, Hangzhou, China ]
Qinghua Chi [ State Key Lab of Industrial Control Technology Department of Control Science & Engineering, Zhejiang Unversity, Hangzhou, China ]
Jun Liang [ State Key Lab of Industrial Control Technology Department of Control Science & Engineering, Zhejiang Unversity, Hangzhou, China ]
보안공학연구지원센터(IJSIP) [Science & Engineering Research Support Center, Republic of Korea(IJSIP)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Signal Processing, Image Processing and Pattern Recognition
간기
격월간
pISSN
2005-4254
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Signal Processing, Image Processing and Pattern Recognition Vol.9 No.2