In this paper, we propose a novel method to solve the problem of targets association and tracking across multiple cameras of non-overlapping views. The method is divided into two parts. One is an improvement on appearance transfer model, another is an improvement on spatio-temporal transfer model. To learn inter-camera appearance transfer models, lαβ color space is used to calibrate images. By this way, the overall and local information can be used, which has advantage to color transform correction. To learn spatio-temporal transfer model, entry/exit zones of a non-overlapping topology can be effectively estimated by defining valid link and using clustering method. Then a kind of time constrain is set between two nodes to judge whether there is correlation of observations. Experiments show the effectiveness of the proposed method.
목차
Abstract 1. Introduction 2. Improved on Appearance Transfer Model 3. Improved on Spatio-temporal Transfer Model 4. Experimental Results 5. Conclusion References
Liu Suolan [ School of Automation, Southeast University, Nanjing 210096, China, School of Information Science & Engineering, Changzhou University, Changzhou 213164, China, Department of Electrical Engineering, University of Texas at Dallas, Richardson, TX 75080, USA ]
Wang Jia [ School of Information Science & Engineering, Changzhou University, Changzhou 213164, China ]
Sun Changyin [ School of Automation, Southeast University, Nanjing 210096, China ]
Corresponding Author
보안공학연구지원센터(IJSIP) [Science & Engineering Research Support Center, Republic of Korea(IJSIP)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Signal Processing, Image Processing and Pattern Recognition
간기
격월간
pISSN
2005-4254
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Signal Processing, Image Processing and Pattern Recognition Vol.9 No.1