Wan Jiang Han, He Yang Jiang, Tian Bo Lu, Xiao Yan Zhang, Weijian Li
언어
영어(ENG)
URL
https://www.earticle.net/Article/A252459
※ 원문제공기관과의 협약기간이 종료되어 열람이 제한될 수 있습니다.
원문정보
초록
영어
In order to detect defects efficiently and improve the quality of products, this paper puts forward the concept about defect classification model and defect association model by a lot of defect data. The technology of similarity is applied to defect classification model, and the idea of Knowledge Discovery in Database is applied to defect association model. Defect classification model can analyze the defect efficiently and provides the basis of solving problems quickly while defect association model can be used to detect early and prevent problem, which can make effective improvements for testing and development. This paper summed up GUI defect model based on a large number of interface defects. The model is useful to improve the accuracy of forecast and be used for test planning and implementation through the practice of several projects.
목차
Abstract 1. Introduction 2. Related Partition and Similarity 3. Related Association Rules 4. Defect Classification and Association Model 4.1. Defect Classification Model Definition 4.2. Defect Association Model 5. Experimental Results 5.1. Definition of Defect Classifying 5.2. Defect Association Model 6. Conclusions Acknowledgements References
보안공학연구지원센터(IJMUE) [Science & Engineering Research Support Center, Republic of Korea(IJMUE)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Multimedia and Ubiquitous Engineering
간기
월간
pISSN
1975-0080
수록기간
2008~2016
등재여부
SCOPUS
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Multimedia and Ubiquitous Engineering Vol.10 No.7