In recent years, financial risk has become the attention focus of the economic entities around the world. How to effectively control financial risks has become a hotspot in financial community. Currently, the popular financial risk management method is Value at Risk (VaR), which has more practical values and reference values compared with the traditional financial risk management models. Taking the new composite index of Shanghai Stock Exchange (SSE) as sample, this paper calculated the VaR of GARCH, EGARCH and PARCHES models as well as their corresponding GARCH-M, EGARCH -M and PARCH-M models, analyzed the applicability of the model at different confidence levels under different distributional assumptions and evaluated the models by loss function test method. The results show that: 1) the VaR under t distribution is greatly overestimated, so t distribution does not apply to Chinese stock market; 2) the generalized error distribution describes the market risk more accurately than the normal distribution and the VaR calculated in PARCH (1,1) model under generalized error distribution is the best; 3)the VaR-PARCH (1,1)-GED model is more suitable to measure the investment risk of Chinese stock market.
목차
Abstract 1. Introduction 2. Basic Characteristics of the Daily Yield Rate Series of Chinese Stock Market Index 2.1 Selection of the Sample Data 2.2 Characteristics Analysis of the Daily Yield Rate Series 2.3 Results and Analysis of VaR of Chinese Stock Market Index 3. Conclusions Acknowledgements References
키워드
VaRGARCH modelloss function test
저자
Wu Yudong [ School of Basic Science, Harbin University of Commerce, Harbin ]
보안공학연구지원센터(IJUNESST) [Science & Engineering Research Support Center, Republic of Korea(IJUNESST)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of u- and e- Service, Science and Technology
간기
격월간
pISSN
2005-4246
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of u- and e- Service, Science and Technology Vol.8 No.4