This paper deals about image processing of log internal decays using MATLAB technique. Specifically, image enhancement, image edge detection and decay area extraction and calculation on the two-dimension image of log inner decays that were derived by using the non-destructive inspection technique of stress wave were conducted. The results showed that the testing image of stress wave can visually reflect wood inner decay, and the image resolution can also be improved by using the functions of image enhancement and edge detection in MATLAB software. The detection precision of stress wave is closely associated with the ratio of log internal decay area to tested wood cross-sectional area. When the ratio between wood actual inner decay area and tested log cross-sectional area increased from 4.77% to 45.52%, the relative error between tested decay area and actual decay area reduced from 16.42% to 7.39%. The study has provided an advanced method to judge the degree of wood inner decay for most forest practioners and researchers. Through the image processing and computing on the images derived by stress wave testing, the accuracy of logs internal decay discrimination can be significantly improved.
목차
Abstract 1. Introduction 2. Stress Wave Testing 2.1. Testing System 2.2. Testing System 3. Log Image Processing 3.1. Image Enhancement Processing 3.2. Edge Detection and Processing 4. Recognition and Calculation of Log Inner Decay 5. Conclusions Acknowledgements References
보안공학연구지원센터(IJSIP) [Science & Engineering Research Support Center, Republic of Korea(IJSIP)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Signal Processing, Image Processing and Pattern Recognition
간기
격월간
pISSN
2005-4254
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Signal Processing, Image Processing and Pattern Recognition Vol.8 No.2