Earticle

초록

영어

As an emerging technology for on-chip interconnect scaling in vertical direction in semiconductor industry, through-silicon-via (TSV) demonstrates its advantages and has been adopted for 3D SoC implementation. Optimal test architecture and test scheduling are significant for stacked 3D SoC design. However existing design methods cannot achieve both optimal test time and individual rationality. In this paper, game theory based 3D SoC test architecture optimization and test scheduling method is proposed under constraints of the available number of TSVs for test time minimization and rational test band width allocation. VCG algorithm is brought to 3D SoC design. Three kinds of stacked SoCs are built using ITC’02 SoC test benchmarks, and experimental results on them show the advantages of the proposed method over prior work.

목차

Abstract
 1. Introduction
 2. Related Works
 3. Problem Definition
  3.1. Test Architecture for Stacked SoC
  3.2. Test Architecture Optimization for 3D SoC
 4. 3D SoC Test Optimization Model
  4.1. Problem Formulation
  4.2. 3D SoC Test Architecture Optimization
  4.3. Algorithm for 3D SoC Test Optimization Based on Game Theory
  4.4. Nash Equilibrium
 5. Experimental Results
 6. Conclusion
 Acknowledgements
 References

키워드

저자

• Jingbo Shao [ Postdoctoral Research Station of Information and Communication Engineering, Harbin Engineering University, Harbin 150001, China, College of Computer Science and Information Engineering, Harbin Normal University, Harbin 150025, China ]
• Yongqing Fu [ Postdoctoral Research Station of Information and Communication Engineering, Harbin Engineering University, Harbin 150001, China ]
• Xiaoxiao Liu [ College of Information, Beijing City University, Beijing 100083, China ]
• Guohui Zhou [ College of Computer Science and Information Engineering, Harbin Normal University, Harbin 150025, China ]

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  International Journal of Multimedia and Ubiquitous Engineering

• 간기

  월간

• pISSN

  1975-0080

• 수록기간

  2008~2016

• 등재여부

  SCOPUS

• 십진분류

  KDC 505 DDC 605