Sangyoon Lee, Jongho Choi, Dongmin Kim, Yonghyun Kwon, Seokho Kim, Kideok Sim, Jeonwook Cho
언어
영어(ENG)
URL
https://www.earticle.net/Article/A223043
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※ 학술발표대회집, 워크숍 자료집 중 4페이지 이내 논문은 '요약'만 제공되는 경우가 있으니, 구매 전에 간행물명, 페이지 수 확인 부탁 드립니다.
4,000원
원문정보
초록
영어
HTS power cable bypass the fault current through the former to protect superconducting tapes. On the other hand, the fault current limiting (FCL) power cable can be considered to mitigate the fault current using its increased inductance and resistance. Using the increased resistance of the cable is similar to the conventional resistive fault current limiter. In case of HTS power cable, the magnetic field of HTS power cable is mostly shielded by the induced current on the shield layer during normal operation. However, quench occurs at the shield layer and its current is kept below its critical current at the fault condition. Consequently, the magnetic field starts to spread out and it generates additional inductive impedance of the cable. The inductive impedance can be enhanced more by installing materials of high magnetic susceptibility around the HTS power cable. It is a concept of SFCL power cable. In this paper, a sample SFCL power cable is suggested and experimental results are presented to investigate the effect of iron cover on the impedance generation. The tests results are analyzed to verify the generation of the inductive and resistive impedance. The analysis results suggest the possible applications of the SFCL power cable to reduce the fault current in a real grid.
목차
Abstract 1. INTRODUCTION 2. OPERATION CHARACTERISTIC OF SFCL POWER CABLE 3. EXPERIMENTAL APPARATUS 4. EXPERIMENTAL PROCEDURE AND RESULTS 5. ANALYSIS OF THE EXPERIMENTAL RESULTS 6. CONCLUSION ACKNOWLEDGMENT REFERENCES
키워드
HTS Power CableQuenchSFCLImpedance
저자
Sangyoon Lee [ Changwon National University, Changwonl, Korea ]
Jongho Choi [ Changwon National University, Changwonl, Korea ]
Dongmin Kim [ Changwon National University, Changwonl, Korea ]
Yonghyun Kwon [ Changwon National University, Changwonl, Korea ]
Seokho Kim [ Changwon National University, Changwonl, Korea ]
Corresponding author
Kideok Sim [ Korea Electrotechnology Research Institute, Changwon, Korea ]
Jeonwook Cho [ Korea Electrotechnology Research Institute, Changwon, Korea ]