Earticle

초록

영어

A testing system has been designed to detect the single event upset failure of SRAM chips in this paper: a visual test bench for failure monitoring is developed based on LabVIEW, it could perform the task of data acquisition, storage and results analysis. At the testing board, the test vectors based on March C- algorithm are written to the reference SRAM and the under-test SRAM through FPGA. NI HSDIO-6548 card is used to collect all the data from the SRAMs, judging whether SEU failure occurred according to comparison results. The system could accomplish the work of real-time monitoring the failure status and test process with a good extensibility.

목차

Abstract
 1. Introduction
 2. March C- algorithm Description
 3. The Main Components and Principle of Testing System
  3.1 The brief introduction of LabVIEW visual test platform
  3.2 Test vectors ejected procedure
 4. Test Process and Results Analysis
  4.1 Functional simulation of the testing system
  4.2 Test for SRAM chips
 5. Conclusions
 Acknowledgements
 References

키워드

저자

• Peng Wang [ Tianjian Key Laboratory for Civil Aircraft Airworthiness and Maintenance, Civil Aviation University fo China ]
• Zhen Li [ College of Safety Science & Enginerring, Civil Aviation University of China, Tianjin 300300, China ]
• Chengxiang Jiang [ College of Safety Science & Enginerring, Civil Aviation University of China, Tianjin 300300, China ]
• Wei Shao [ College of Safety Science & Enginerring, Civil Aviation University of China, Tianjin 300300, China ]
• Qiannan Xue [ Tianjian Key Laboratory for Civil Aircraft Airworthiness and Maintenance, Civil Aviation University fo China ] Correspoinding author

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  International Journal of Hybrid Information Technology

• 간기

  격월간

• pISSN

  1738-9968

• 수록기간

  2008~2016

• 십진분류

  KDC 505 DDC 605