Jagadeesh D. Pujari, Rajesh Yakkundimath, Abdulmunaf S. Byadgi
언어
영어(ENG)
URL
https://www.earticle.net/Article/A214484
※ 원문제공기관과의 협약기간이 종료되어 열람이 제한될 수 있습니다.
원문정보
초록
영어
This paper describes Support Vector Machine (SVM) and Artificial Neural Network (ANN) based recognition and classification of visual symptoms affected by fungal disease. Color images of fungal disease symptoms affected on cereals like wheat, maize and jowar are used in this work. Different types of symptoms affected by fungal disease namely leaf blight, leaf spot, powdery mildew, leaf rust, smut are considered for the study. The developed algorithms are used to preprocess, segment, extract features from disease affected regions. The affected regions are segmented using k-means segmentation technique. Color texture features are extracted from affected regions and then used as inputs to SVM and ANN classifiers. The texture analysis is done using Color Co-occurrence Matrix. Tests are performed to classify image samples. Classification accuracies between 68.5% and 87% are obtained using ANN classifier. The average classification accuracies have increased to 77.5% and 91.16% using SVM classifier.
목차
Abstract 1. Introduction 2. Materials and Methods 2.1. Image Set 2.2. Image Preprocessing 2.3. Segmentation 2.4. Feature Extraction 2.5. Classifiers 4. Results and Discussion 5. Conclusion Acknowledgement References
보안공학연구지원센터(IJSIP) [Science & Engineering Research Support Center, Republic of Korea(IJSIP)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Signal Processing, Image Processing and Pattern Recognition
간기
격월간
pISSN
2005-4254
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Signal Processing, Image Processing and Pattern Recognition Vol.6 No.6