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In this study, the homogeneity of critical current, Ic, along the lengthwise direction in the coated conductor (CC) tape under uniaxial tension was investigated using a multiple voltage tap configuration. Initially, a gradual and homogeneous Ic degradation occurred in all subsections of the tape up to a certain strain value. This was followed by an abrupt Ic degradation in some subsections, which caused scattering in Ic values along the length with increasing tension strain. The Ic degradation behaviour was also explained through n-value as well as microstructure analyses. Subsections showed Ic scattering corresponding to damaged areas of the CC tape revealed that transverse cracks were distributed throughout the gauge length. This homogeneous Ic degradation behaviour under tension is similar with the case under torsion strain but different with the case under hard bending which were previously reported. This behaviour is also different with the case using Bi-2223 HTS tapes under tension strain.
J. R. C. Dizon [ Department of Mechanical Design Engineering, Andong National University, Andong, Kyungbuk, 760-749 Korea, College of Engineering and Architecture, Bataan Peninsula State University, Balanga, Bataan, 2100 Philippines ]
S. S. Oh [ Korea Electrotechnology Research Institute, Changwon, 641-120 Korea ]
K. D. Sim [ Korea Electrotechnology Research Institute, Changwon, 641-120 Korea ]
H. S. Shin [ Department of Mechanical Design Engineering, Andong National University, Andong, Kyungbuk, 760-749 Korea ]
Corresponding author