Keypoint selection is the important step in object recognition, including general object classification, human tracing and human pose discrimination etc .This paper proposes a more accurate modified key point selection algorithm by modifying SIFT in the stage of extreme point selection. In machine vision or computer vision, including human pose recognition, to select key points, the traditional SIFT completes this according to the extremes derived from LoG (Laplacian of Gaussian) convolution with image, which provides scale invariance features for key points. The extreme points’ position is the foundation of feature descriptor for the gradient calculation in the next step. But in the process of images convoluting with the difference of Gaussian function to attain the extreme point, bias is produced because the extreme points’ positions aren’t accurate. We modify the extreme points’ selection to make key points more accurate with less bias to the theoretical points. Simulation with about 3500 images of different resolutions gives the AIPR (adjusted interest point ratio) and illustrates the universality of extreme points’ selection and verifies the values of this algorithm.
목차
Abstract 1. Introduction 2. Scale invariance in SIFT key point extraction 3. Modified feature extreme point extraction 4. Experiments and result 4.1. Selecting dataset 4.2. Interest point position bias 4.3. Adjusting the interest point 5. Conclusion and outlook Acknowledgements References
보안공학연구지원센터(IJSIP) [Science & Engineering Research Support Center, Republic of Korea(IJSIP)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Signal Processing, Image Processing and Pattern Recognition
간기
격월간
pISSN
2005-4254
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Signal Processing, Image Processing and Pattern Recognition Vol.6 No.2