Earticle

초록

영어

Test suite reduction aims at improving the effectiveness of testing and cutting down the test cost with the least test cases under the condition of satisfying all testing objectives. This paper proposes a new method for test suite reduction with test requirement partition. First, it gives a partition to the set of all the available test cases based on the test requirements. After that, a test suite by the partition is generated and then a smaller test suite is obtained by further reduction according to the relationship between test requirements and test suites. At last, the experimental result shows that the proposed approach is helpful to generate the reduced test suite, which is used to test all the test requirements sufficiently by comparing with the existed methods, at the cost of a moderate loss in fault detection capability.

목차

Abstract
 1. Introduction
 2. Related Work
  2.1. Research Question
  2.2. Literature Review
 3. Test Suite Reduction based on Test Requirement Partition
  3.1. Concept and Notation
  3.2. Concept and Notation
  3.3. Test Suite Reduction Algorithm
 4. Experimental Study
 5. Conclusion
 Acknowledgements
 References

키워드

저자

• Wan Yongbing [ School of Electronics & Information Engineering, Tongji University ]
• Xu Zhongwei [ School of Electronics & Information Engineering, Tongji University ]
• Yu Gang [ Sydney Institute of Language and Commerce, Shanghai University ]
• Zhu YuJun [ School of Electronics & Information Engineering, Tongji University ]

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  International Journal of Grid and Distributed Computing

• 간기

  격월간

• pISSN

  2005-4262

• 수록기간

  2008~2016

• 십진분류

  KDC 505 DDC 605