Chen Deyun, Li Zhiqiang, Gao Ming, Wang Lili, Yu Xiaoyang
언어
영어(ENG)
URL
https://www.earticle.net/Article/A206592
※ 원문제공기관과의 협약기간이 종료되어 열람이 제한될 수 있습니다.
원문정보
초록
영어
According to the image reconstruction accuracy influenced by the “soft field” nature and the limited projection data in electrical capacitance tomography, based on the working principle of the electrical capacitance tomography system, a Novel image reconstruction algorithm based on compressed sensing is proposed in the paper. The method based on ART (algebra reconstruction technique) organically combines the gradient sparse of image and ART, and reduces the norm of image gradient with full-variational method, and improves the accuracy and speed of image reconstruction. Experimental results and simulation data indicate that the imaging accuracy is markedly improved, and the image is closed to the prototype. This new algorithm presents a feasible and effective way to research on image reconstruction algorithm for Electrical Capacitance Tomography System.
목차
Abstract 1. Introduction 2. Basic Principle of ECT System 2.1. Structure ECT System 2.2. Measurement Principle 2.3. Mathematical Principle of Image Reconstruction 3. Image Reconstruction Algorithm based on Compressed Sensing 3.1. Compressed Sensing Principle 3.2. Minimum Full-variational Method 4. Author Name(s) and Affiliation(s) 3.3. ART Image Reconstruction Algorithm based on Compressed Sensing 4. Experimental Results and Analysis Acknowledgements References
보안공학연구지원센터(IJSIP) [Science & Engineering Research Support Center, Republic of Korea(IJSIP)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Signal Processing, Image Processing and Pattern Recognition
간기
격월간
pISSN
2005-4254
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Signal Processing, Image Processing and Pattern Recognition Vol.6 No.4