Earticle

초록

영어

According to embedded IP core structure and various DFT strategies, it is difficult to test NoC-based SoC especially for reuse situation. The paper proposes the design of a compatible IEEE 1500 standard core test wrapper, which makes different IP cores homogeneous from the point of test integration. A test response comparator is added to the test wrapper, which is capable of verifying directly whether there is failure in this IP. The comparator not only improves testing efficiency and also supports various test modes. The function and timing simulation of proposed wrapper are accomplished on ISCAS '89 circuits. A 2D Mesh NoC was constructed based on these wrappered IP cores and implemented unicast and multicast testing. The experimental results show that the wrapper can effectively realize embedded IP test access and isolation, and has the good adaptability to support various NoC test strategies.

목차

Abstract
 1. Introduction
 2. Test Process of NoC Embedded IP Core
 3. Wrapper and Test Interface Design
 4. Experiment Results
 5. Conclusion
 Acknowledgements
 References

키워드

저자

• Zhang Ying [ Nanjing University of Aeronautics and Astronautics ]
• Wu Ning [ Nanjing University of Aeronautics and Astronautics ]
• Ge Fen [ Nanjing University of Aeronautics and Astronautics ]
• Chen Xin [ Nanjing University of Aeronautics and Astronautics ]
• Zhou Lei [ Yangzhou University ]

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  International Journal of Control and Automation

• 간기

  월간

• pISSN

  2005-4297

• 수록기간

  2008~2016

• 십진분류

  KDC 505 DDC 605