Jae Young Jang, Woo Seung Lee, Jiho Lee, Young Jin Hwang, Hyun Chul Jo, Min Cheol Ahn, Kyeon Hur, Tae Kuk Ko
언어
영어(ENG)
URL
https://www.earticle.net/Article/A176277
※ 기관로그인 시 무료 이용이 가능합니다.
※ 학술발표대회집, 워크숍 자료집 중 4페이지 이내 논문은 '요약'만 제공되는 경우가 있으니, 구매 전에 간행물명, 페이지 수 확인 부탁 드립니다.
4,000원
원문정보
초록
영어
This paper presents simulation and small-scale experimental tests of a fault current controller. Smart fault controller as proposed and proven conceptually in our previous work is promising technology for the smart power grid where distributed and even stochastic generation sources are prevalent and grid operations are more dynamic. Existing protection schemes simply limiting the fault current to the pre-determined set values may not show best performance and even lead to coordination failures, potentially leading to catastrophic failure. Thus, this paper designs fault current controller with a full bridge thyristor rectifier, embedding a superconducting coil for which the controller is electrically invisible during normal operation because the loss due to the coil is near-zero. When a fault occurs and the resulting current through the superconducting coil exceeds a certain value set intelligently based on the current operating condition of the grid, the magnitude of the fault current is controlled to this desired value by adjusting the firing angles of thyristors such that the overall system integrity is successfully maintained. Detailed time-domain simulations are performed and lab-scale testing circuits are built to demonstrate the desired functionality and efficacy of the proposed fault current controller.
목차
Abstract 1. INTRODUCTION 2. OPERATING PRINCIPLE AND STRUCTURE OF FCC 3. EXPERIMENTAL SETUP 3.1. The thyristor control circuit 3.2. Superconducting Coil 4. EXPERIMENTS AND ANALYSIS 5. CONCLUSION ACKNOWLEDGMENT REFERENCES
저자
Jae Young Jang [ School of Electrical and Electronic Engineering, Yonsei University, Korea ]
Woo Seung Lee [ School of Electrical and Electronic Engineering, Yonsei University, Korea ]
Jiho Lee [ School of Electrical and Electronic Engineering, Yonsei University, Korea ]
Young Jin Hwang [ School of Electrical and Electronic Engineering, Yonsei University, Korea ]
Hyun Chul Jo [ School of Electrical and Electronic Engineering, Yonsei University, Korea ]
Min Cheol Ahn [ Department of Electrical Engineering, Kunsan National University, Gunsan ]
Kyeon Hur [ School of Electrical and Electronic Engineering, Yonsei University, Korea ]
Tae Kuk Ko [ School of Electrical and Electronic Engineering, Yonsei University, Korea ]
Corresponding Author