Earticle

초록

영어

The present study has investigated the patterns and the causes of safety -accidents on the accident-data in semiconductor Industries through near miss report the cases in the advanced companies. The ratio of incomplete actions to incomplete state was 4 to 6 as the cases of accidents in semiconductor industries in the respect of Human-ware, Hard- ware, Environment-ware and System-ware. The ratio of Human to machine in the attributes of semiconductor accident was 4 to 1. The study also investigated correlation among the system related to production, accident, losses and time. In semiconductor industry, we found that pattern of safety-accident analysis is organized potential, interaction, complexity, medium. Therefore, this study find out that semiconductor model consists of organization, individual, task, machine, environment and system.

목차

Abstract
 1. 연구의 배경
 2. 안전사고 Pattern에 대한 고찰
  2.1 선진사례연구 분석
  2.2 반도체산업에서의 안전사고 원인 분석
 3. 기존 Model 과 반도체산업의 Model 추출
  3.1 Reason's Accident Causation Model 분석
  3.2 Perrow's Normal Accident Theory Model
  3.3 반도체산업에서의 수행인자 분석
  3.4 반도체산업에서의 사고이론 추출 Model
  3.5 반도체산업의 수행인자의 ANOVA 분석
 4. 결론
 5. 참고문헌

키워드

저자

• 윤용구 [ Yoon Yong Gu | 아주대학교 산업공학과 박사과정 수료 ]
• 박범 [ Park Peom | 아주대학교 산업정보시스템공학부 ]

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  대한안전경영과학회지 [Journal of Korea Safety Management & Science]

• 간기

  계간

• pISSN

  1229-6783

• eISSN

  2288-1484

• 수록기간

  1999~2025

• 십진분류

  KDC 530 DDC 620