As the ubiquitous computing becomes popular, its applications come to real life as a form of a wide variety of ubiquitous decision support systems (UDSS). However, such ubiquity should be supported by prediction capability no matter which kind of contexts users are in. In this sense, context prediction capability, which is to predict future contexts users are going to enter sooner or later, becomes an extremely important part of ubiquitous decision support systems. This study proposes a new breed of context prediction mechanism using the Markov Blanket obtained from General Bayesian Network (GBN) as a main vehicle. To improve the prediction accuracy, ensemble of robust prediction classifiers is suggested on the basis of the GBN Markov Blanket. Three classifiers included in the ensemble mechanism are Bayesian networks, decision classifiers, and an SVM (Support Vector Machine). The proposed GBN Markov blanket-assisted ensemble classifier is applied to a real dataset of location prediction. Results were promising enough to conclude that the proposed ensemble classifier based on the GBN Markov Blanket is worthwhile for being adopted in developing a powerful context prediction purpose UDSS. Practical implications are also discussed with future research issues.
Kun Chang Lee [ Professor of MIS at SKK Business School WCU Professor of Creativity Science at Department of Interaction Science Sungkyunkwan University ]
Heeryon Cho [ Department of Interaction Science Sungkyunkwan University ]
보안공학연구지원센터(IJUNESST) [Science & Engineering Research Support Center, Republic of Korea(IJUNESST)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of u- and e- Service, Science and Technology
간기
격월간
pISSN
2005-4246
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of u- and e- Service, Science and Technology vol.3 no.3