Edge detection plays an important role in digital image processing. Based on the non-decimated wavelet which is shift invariant, in this paper, we develop a new edge detection technique using Hidden Markov Chain (HMC) model. With this proposed model (NWHMC), each wavelet coefficient contains a hidden state, herein, we adopt Laplacian model and Gaussian model to represent the information of the state “big” and the state “small”. The model can be trained by EM algorithm, and then we employ Viterbi algorithm to reveal the hidden state of each coefficient according to MAP estimation. The detecting results of several images are provided to evaluate the algorithm. In addition, the algorithm can be applied to noisy images efficiently.
목차
Abstract 1. Introduction 2. Edge detection using HMC model based on non-decimated wavelet(NWHMC) 2.1. Statistical model for individual wavelet coefficients 2.2. Hidden Markov Chain considering the inter-scale dependence 2.3. Training parameters and Searching for hidden states 3. Experimental results and analysis 3.1. Realization of our algorithm and parameter selection 3.2. Comparisons with Canny algorithm and WD-VHMT 3.3. Experiments of noisy images using our algorithm 4. Conclusion 5. References
저자
Renqi Zhang [ Dept. of Electronic Engineering, The Chinese University of Hong Kong ]
Wanli Ouyang [ Dept. of Electronic Engineering, The Chinese University of Hong Kong ]
Wai-Kuen Cham [ Dept. of Electronic Engineering, The Chinese University of Hong Kong ]
보안공학연구지원센터(IJSIP) [Science & Engineering Research Support Center, Republic of Korea(IJSIP)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Signal Processing, Image Processing and Pattern Recognition
간기
격월간
pISSN
2005-4254
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Signal Processing, Image Processing and Pattern Recognition vol.2 no.1