Earticle

초록

영어

Events are crammed with numerous basic elements in today’s management and manufacturing system. Especially, for a large-scale system, there are thousands of independent messages (events) happening every second. How to integrate the information and how to deal with such massive events are faced by most of the system. Event monitoring and processing has been posed in manufacturing corporations to tackle this challenge. However, well-prepared methodology and processing are lack for this challenge. In this article, we propose an extensible event-driven manufacturing platform for handling those massive events. First, holistic architecture of the platform is depicted. Next, the principle of primitive and complex event is detailed. Eventually, Complex Event Processing (CEP) approach is applied to the platform.

목차

Abstract
 1. Introduction
 2. Literature review
 3. Extensible event-driven manufacturing system
  3.1 Database
  3.2 Publish/subscribe mechanism
  3.3 User Interfaces
  3.4 Event configuration
  3.5 Event buffer zone (EBZ)
  3.6 Event analyzer
 4. CEP application
  4.1 Event in the system
  4.2 Approach of the event definition
  4.3 Model in the CEP application
  4.4 Multi-view definitions
  4.5 Case study
 5. Conclusion
 6. Future work
 References

키워드

저자

• Y.H. Zhang [ Faculty of Information Engineering, Guangdong University Technology, Guangzhou, China ]
• Q.Y. Dai [ Faculty of Information Engineering, Guangdong University Technology, Guangzhou, China ]
• R.Y. Zhong [ Department of Industrial and Manufacturing Systems Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong ]

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  International Journal of Control and Automation

• 간기

  월간

• pISSN

  2005-4297

• 수록기간

  2008~2016

• 십진분류

  KDC 505 DDC 605