Saoussen Rekhis, Nadia Bouassida, Rafik Bouaziz, Claude DUVALLET, Bruno SADEG
언어
영어(ENG)
URL
https://www.earticle.net/Article/A147378
※ 원문제공기관과의 협약기간이 종료되어 열람이 제한될 수 있습니다.
원문정보
초록
영어
Real-Time (RT) applications, which manipulate important volumes of data, need to be managed with RT databases that deal with time-constrained data and time-constrained transactions. In spite of their numerous advantages, RT databases development remains a complex task, since developers must study many design issues related to the RT domain. In this paper, we tackle this problem by proposing RT design patterns that allow the modeling of structural and behavioral aspects of RT databases. We show how RT design patterns can provide design assistance through architecture reuse of reoccurring design problems. In addition, we present an UML profile that represents patterns and facilitates further their reuse. This profile proposes, on one hand, UML extensions allowing to model the variability of patterns in the RT context and, on another hand, extensions inspired from the MARTE (Modeling and Analysis of Real-Time Embedded systems) profile.
목차
Abstract 1. Introduction 2. Related work 3. The UML profile for RT design patterns 3.1. Extensions for specifying and instantiating design patterns 3.2. The profile Metamodel 4. RT sensor pattern 4.1. RT sensor pattern specification 4.2. RT sensor pattern supporting multi-version RT data 5. RT design patterns instantiation examples 5.1. Air traffic control system example 5.2. Freeway traffic management system example 6. Conclusion References
보안공학연구지원센터(IJAST) [Science & Engineering Research Support Center, Republic of Korea(IJAST)]
설립연도
2006
분야
공학>컴퓨터학
소개
1. 보안공학에 대한 각종 조사 및 연구
2. 보안공학에 대한 응용기술 연구 및 발표
3. 보안공학에 관한 각종 학술 발표회 및 전시회 개최
4. 보안공학 기술의 상호 협조 및 정보교환
5. 보안공학에 관한 표준화 사업 및 규격의 제정
6. 보안공학에 관한 산학연 협동의 증진
7. 국제적 학술 교류 및 기술 협력
8. 보안공학에 관한 논문지 발간
9. 기타 본 회 목적 달성에 필요한 사업
간행물
간행물명
International Journal of Advanced Science and Technology
간기
월간
pISSN
2005-4238
수록기간
2008~2016
십진분류
KDC 505DDC 605
이 권호 내 다른 논문 / International Journal of Advanced Science and Technology vol.23