Earticle

초록

영어

The Ic degradation behavior of critical current in differently processed YBCO and SmBCO CC tapes with IBAD template has been investigated. It has been known that the residual strain in the CC tape will influence the shape of the Ic-strain window; Ic may show a peak value if there exist a residual strain induced in the tape during manufacturing. The difference of residual strain may be resulted from the adopted different deposition techniques. In this study, bending test of CC tapes has been done using the Goldacker bending test rig which can produce both compressive and tensile bending strain continuously or alternately to the sample. For SmBCO CC tapes, in continuous compressive bending test, Ic showed a minimal increase and did not degrade up to the largest strain that can be applied using the bending rig equivalent to 1.15% based on the sample thickness. However, in the case of alternate application of compressive and tensile bending strain, Ic showed a larger degradation and a lower reversible limit when compared with the case of continuous application of the bending strain. When Ic started to degrade significantly at the tension side, the reversibility ended, also at the compression side which is resulted from the permanent deformation like delamination or cracks that was induced due to tensile bending strain.

키워드

저자

• H.S. Shin [ 신형섭 | 안동대학교 ] Corresponding author
• M. J. Dedicatoria [ M.J. Dedicatoria | 안동대학교 ]
• N.J. Lee [ 이남진 | 한국과학기술원 ]
• S.S. Oh [ 오상수 | 한국전기연구원 ]

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  한국초전도·저온논문지 (구 한국초전도저온공학회논문지) [Progress in Superconductivity and Cryogenics]

• 간기

  계간

• pISSN

  1229-3008

• eISSN

  2287-6251

• 수록기간

  1999~2025

• 등재여부

  KCI 등재,SCOPUS

• 십진분류

  KDC 427 DDC 537