Earticle

초록

영어

Study of different patterns on a local neighborhood of a texture plays an important role in
characterization, and classification of the textures. The present paper proposes a method for
measuring the occurrence factor of patterns on a randomly thresholded binary image. For
this process eight simple patterns are chosen on a 3×3 neighborhood. The simple patterns
are chosen in such a way that any complex pattern can be formed by grouping one or more of
these simple patterns. The pattern occurrence factor of different binary images is also
compared with the actual binary texture image. The experimental results on sixty four
textures indicate good comparison of variation of occurrence in these patterns on different
binary images of random threshold

목차

Abstract
 1. Introduction
 2. Methodology
 3. Results and Discussions
 4. Conclusions
 Acknowledgements
 References
 Authors

키워드

저자

• B. V. Ramana Reddy [ Associate Proessor, Dept. of CSE, KSRM COE., Kadapa, A.P., India ]
• A. Suresh [ Research Scholar, JNT University, Anantapur, A.P., India ]
• K.V.Subbaiah [ Assoc. Prof., Dept. of CSE, PBR Visvodaya Inst. of Tech.&Sci., Kavali, A.P., India ]
• Dr.B. Eswara Reddy [ Assoc. Prof., Dept. of CSE, JNTU College of Engg., Anantapur, A.P., India ]

참고문헌

발행기관

간행물

표지보기 관심저널 등록

• 간행물명

  International Journal of Hybrid Information Technology

• 간기

  격월간

• pISSN

  1738-9968

• 수록기간

  2008~2016

• 십진분류

  KDC 505 DDC 605