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Semiconductor Characteristics Prediction with Gaussian Process Regression

  • 간행물
    한국차세대컴퓨팅학회 학술대회 바로가기
  • 권호(발행년)
    The 7th International Conference on Next Generation Computing 2021 (2021.11) 바로가기
  • 페이지
    pp.238-239
  • 저자
    Suhan Son, Junhee Seok
  • 언어
    영어(ENG)
  • URL
    https://www.earticle.net/Article/A448055

원문정보

초록

영어
Gaussian process regression (GPR) is a nonparametric Bayesian methodology that is applied in various places in machine learning. GPR can identify uncertainty by learning data, predicting well, and obtaining variance in prediction. We conducted a study to predict and verify characteristics using a design parameter of a semiconductor using this GPR. In addition, by predicting the characteristic value of the secondary semiconductor derived from the predicted characteristics, it is possible to confirm the characteristics of the generated semiconductor.

목차

Abstract
I. INTRODUCTION
II. RELATED WORK
A. Gaussian process regression
III. DESIGN & IMPLEMENTATION
A. Datasets
B. Experiment result R2
C. Experiment result error
IV. CONCLUSION
ACKNOWLEDGMENT
REFERENCES

저자

  • Suhan Son [ School of Electrical Engineering Korea University ]
  • Junhee Seok [ School of Electrical Engineering Korea University ] Corresponding Author

참고문헌

자료제공 : 네이버학술정보

    간행물 정보

    • 간행물
      한국차세대컴퓨팅학회 학술대회
    • 간기
      반년간
    • 수록기간
      2021~2025
    • 십진분류
      KDC 566 DDC 004