Earticle

초록

영어

With the recent development of computer technology, machine learning is being applied to the semiconductor field. However, it takes a lot of time in existing simulators to make a large number of samples required for this. In this paper, samples were produced in two ways to obtain samples in a short time. The similarity between the data of the generated samples and the real data distribution was measured and compared.

목차

Abstract
I. INTRODUCTION
II. MATERIALS AND METHODS
A. Semiconductor data
B. Interpolation
C. Conditional GAN
D. KL divergence
III. RESULTS AND DISCUSSION
IV. CONCLUSION
ACKNOWLEDGMENT
REFERENCES

저자

• Donghyun Tae [ School of Electrical Engineering Korea University ]
• Junhee Seok [ School of Electrical Engineering Korea University ] Corresponding Author

참고문헌