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Feature Selection for Multi-Class Support Vector Machines Using an Impurity Measure of Classification Trees: An Application to the Credit Rating of S&P 500 Companies

  • 간행물
    Asia Pacific Journal of Information Systems KCI 등재 바로가기
  • 권호(발행년)
    제21권 제2호 (2011.06) 바로가기
  • 페이지
    pp.43-58
  • 저자
    Taeho Hong, Jiyoung Park
  • 언어
    영어(ENG)
  • URL
    https://www.earticle.net/Article/A145756

원문정보

초록

영어
Support vector machines (SVMs), a machine learning technique, has been applied to not only binary classification problems such as bankruptcy prediction but also multi-class problems such as corporate credit ratings. However, in general, the performance of SVMs can be easily worse than the best alternative model to SVMs according to the selection of predictors, even though SVMs has the distinguishing feature of successfully classifying and predicting in a lot of dichotomous or multi-class problems. For overcoming the weakness of SVMs, this study has proposed an approach for selecting features for multi-class SVMs that utilize the impurity measures of classification trees. For the selection of the input features, we employed the C4.5 and CART algorithms, including the stepwise method of discriminant analysis, which is a well-known method for selecting features. We have built a multi-class SVMs model for credit rating using the above method and presented experimental results with data regarding S&P 500 companies.

목차

Abstract
 Ⅰ. Introduction
 Ⅱ. Literature Review
  2.1 Feature selection
  2.2 Multi-Class Support Vector Machines
 Ⅲ. Research Framework
 Ⅳ. Experiments and Results
  4.1 Data
  4.2 Feature selection
  4.3 SVMs Model Specification and Results
 Ⅴ. Conclusions
 References

저자

  • Taeho Hong [ Associate Professor, School of Business, Pusan National University ]
  • Jiyoung Park [ Post-Doc, BK21 Research and Education Institute, Pusan National University ] Corresponding author

참고문헌

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    간행물 정보

    • 간행물
      Asia Pacific Journal of Information Systems
    • 간기
      계간
    • pISSN
      2288-5404
    • eISSN
      2288-6818
    • 수록기간
      1990~2026
    • 등재여부
      KCI 등재,SCOPUS
    • 십진분류
      KDC 325 DDC 658